Title | Processes | Material | Chamber Principle | Chamber Hardware | Supplier | Topic | |
---|---|---|---|---|---|---|---|
Favorable working point and process improvement | Metal | ICP | TCP® | LAM | Development | ![]() | |
Product mix issue depending on chamber dedication | Stack | Polysilicon / a-Si | ICP | LAM | Development | ![]() | |
B-field real time supervision | MERIE | AMAT | Development | ![]() | |||
Magnetic field and process stability | MERIE | AMAT | Development | ![]() | |||
Uniformity and Process transfer | CVD | Polysilicon / a-Si | PE-CVD | AKT | AMAT | Development | ![]() |