Title |
Processes |
Material |
Chamber Principle |
Chamber Hardware |
Supplier |
Topic |
|
Arcing in gas distribution | | | MERIE | MxP | AMAT | Maintenance | ![](/images/lupe.gif) |
Magnetic field failure | | | MERIE | MxP | AMAT | Maintenance | ![](/images/lupe.gif) |
Instable chamber pressure | | Oxide | MERIE | | AMAT | FDC | ![](/images/lupe.gif) |
Wet clean and conditioning check | Trench | Crystal Si | MERIE | HART TS | AMAT | Clean / Conditioning | ![](/images/lupe.gif) |
E-chuck fault | Trench | Crystal Si | MERIE | HART | AMAT | FDC | ![](/images/lupe.gif) |
Endpoint verification | | Oxide | MERIE | MxP+ | AMAT | Process Performance | ![](/images/lupe.gif) |
Hard mask erosion | Trench | Crystal Si | MERIE | | AMAT | Process Performance | ![](/images/lupe.gif) |
Instable process start with magnetic field | | | MERIE | | AMAT | Process Performance | ![](/images/lupe.gif) |
Parasitic plasma in He feedthrough | VIA etch | Oxide | MERIE | MxP+ | AMAT | FDC | ![](/images/lupe.gif) |
Open area shifts plasma parameters | VIA etch | Oxide | MERIE | MxP+ | AMAT | Process Performance | ![](/images/lupe.gif) |
Etch rate depends on matchbox | | | MERIE | MxP+ | AMAT | Maintenance | ![](/images/lupe.gif) |
B-field real time supervision | | | MERIE | | AMAT | Development | ![](/images/lupe.gif) |
Magnetic field and process stability | | | MERIE | | AMAT | Development | ![](/images/lupe.gif) |
Arcing at e-chuck | | | MERIE | | | FDC | ![](/images/lupe.gif) |
Optimization of wet clean cycle | | Oxide | MERIE | MxP+ | AMAT | Productivity | ![](/images/lupe.gif) |
Influence of shadow ring material | | Nitride / Oxinitride | MERIE | MxP | AMAT | Clean / Conditioning | ![](/images/lupe.gif) |
Gas composition and process results | | Oxide | MERIE | MxP+ | AMAT | Process Performance | ![](/images/lupe.gif) |
Etch rate dependence on plasma parameters | VIA etch | Nitride / Oxinitride | MERIE | MxP+ | AMAT | Process Performance | ![](/images/lupe.gif) |
Contact angle (slope of side wall) depending on plasma parameters | | | MERIE | MxP+ | AMAT | Process Performance | ![](/images/lupe.gif) |
Insensitive etch rate on test wafers | VIA etch | | MERIE | MxP+ | AMAT | Process Performance | ![](/images/lupe.gif) |
Improved chamber temperature stability | Trench | Oxide Nitride Sandwich | MERIE | HART | AMAT | Clean / Conditioning | ![](/images/lupe.gif) |
Chamber matching | Trench | Crystal Si | MERIE | HART | AMAT | Chamber Matching | ![](/images/lupe.gif) |
De-conditioning by test wafer | Trench | Crystal Si | MERIE | HART | AMAT | Clean / Conditioning | ![](/images/lupe.gif) |
Improve of warm-up | Trench | Crystal Si | MERIE | HART | AMAT | Clean / Conditioning | ![](/images/lupe.gif) |