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2010 © Plasmetrex GmbH

PLASMA SCHOOL FOR SEMICONDUTOR MANUFACTURING

This course provides knowledge on plasma principles and capability of semiconductor manufacturing technologies.

Location: Courses at the Customer Site 

  • 10 - 20 participants
  • Courses on demand
  • Technican and engineer courses

Location: Courses in Berlin

  • Plasma School for Semiconductor Manufacturing
  • November, 2010, Dorint Hotel, Berlin-Adlershof
Plasma School for Semiconductor Manufacturing

Duration:

  • Plasma School for Semiconductor Manufacturing 
    • Plasma Physics Fundamentals: 6 hours
    • Equipment
      • Plasma Etch Tools: 4 hours 
      • Plasma Deposition Tools: 3 hours
    • Process Fundamentals: 2 hours
    • Process and Equipment Interaction
      • Conditioning and Chamber Matching: 4 hours
      • Wafer Damaging, E-chuck, and Arcing: 4 hours
      • Plasma Nitridation of Ultra Thin SiO2 Films: 4 hours

The course includes:

MODULE: PLASMA PHYSICS FUNDAMENTALS

Plasma Physics Fundamentals

  • Elementary plasma physics
  • DC discharge
  • RF discharge
  • CCP - Capacitively Coupled Plasma
  • ICP / TCP® - Inductively Coupled Plasma
  • Electron Cyclotron Resonance
  • NLD - Neutral Loop Discharge
  • Remote and pulsed plasmas
  • RF power in plasma
  • Plasma process control in Fab
  • Methods of plasma diagnostics
Example: Plasma Physics Fundamentals

MODULE: EQUIPMENT

Plasma Etch Tools

Plasma Etch Tools

  • The plasma process, reactor types
  • Capacitively Coupled Plasma
  • MERIE reactors
  • Dual frequency reactors
  • Inductively Coupled Plasma ( ICP / TCP®)
  • Comparison of chamber types
  • Etch chemistry
Example: Plasma Etch Tools
Plasma Deposition Tools

Plasma Deposition Tools

  • Sputtering cleaning
  • Sputter deposition
  • Plasma Enhanced Vapor Deposition
  • Nitridation (summary)
Example: Plasma Deposition Tools

MODULE: PROCESS FUNDAMENTALS

Plasma Processes
 

  • Basics of plasma processing
  • Physical etching (Sputtering)
  • Etching: Chemistry, selectivity, and profiles
  • Limitations of plasma processes
  • Deposition
  • Chamber design
  • Preprocess faults
  • Cost control by quality and process management
Process Fundamentals

MODULE: PROCESS and EQUIPMENT INTERACTION

Conditioning and Chamber Matching

Conditioning and Chamber Matching

  • Motivation
  • Gas heating
  • Memory effects at chamber wall
  • Conditioning
  • Chamber matching
Example: Conditiong and Chamber Matching
Wafer Damaging, E-Chuck, and Arcing

Wafer Damaging, E-Chuck, and Arcing

  • Wafer Charging and Arcing
  • The ElectroStatic Chuck
  • Thermal Conductivity in Thin Gases
  • ESC and Etch Process
  • Chamber Arcing and Particles
  • Specific Problems of Dielectric Wafers
Example: Wafer Damaging, E-chuck, and Arcing


Plasma Nitridation

Plasma Nitridation of ultra thin SIO2 Films

  • RF Plasma
  • Remote Plasma and pulsed RF Plasma
  • Nitridation
Example: Plasma Nitridation